Studentenproject
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THE INVESTIGATION OF POLYMER TEMPLATES BY AFM AND GISAXS DESY SUMMER STUDENT PROGRAMME 2009 Shestakov Mikhail Lomonosov Moscow State University 10th September 2009 Contents 1.. 1.2 Fundamentals of experimental techniques 1.2.1 Atomic Force Microscopy (AFM) The atomic force microscope (AFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.. Depending on the situation, forces that are measured in AFM include mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic forces (see magnetic force microscope, MFM), Casimir forces, solvation forces, etc.. 1.2.2 Grazing Incidence Small Angle X-ray Scattering analysis (GISAXS) Up to fifteen years ago, the scattering techniques were limited to three dimensional samples as the strong penetration depth of the radiations and the low signal to noise ratio hampered the surface sensitivity.. In this respect, the field of semiconductors and thin films growth brought a need of knowledge about layer structure and morphology and sizes of quantum dots, supported islands or buried particles which has pushed towards the development of Grazing Incidence Small Angle X-Ray Scattering (GISAXS)..
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